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  • Dektak XT

    The DektakXT® stylus profiler features a revolutionary design that enables unmatched repeatability o.....

  • Dektak XTL Stylus Profiler System

    Large-Format Wafer and Panel Measurement

  • TI 980 TriboIndenter

    Bruker's most advanced nanomechanical and nanotribological test instrument

  • Dimension FastScan

    The new benchmark for speed with highest resolution and performance

  • ContourGT-X

    Automated, gauge-capable metrology for R&D and production

  • Tribometers UMT Tribolab

    Comprehensive materials testing for mechanical and triobological properties

  • ContourGT-I

    World’s first automated benchtop profiler with tip/tilt in the head

  • FSM128 Film Stress & Wafer Bow

     FSM pioneered and commercialized the laser scanning optical lever (Optilever) technique

  • FSM 500 Film Stress & Wafer Bow

    The FSM 500TC 200mm features a patented auto dual laser technology.

  • Film Adhesion

    FSM offers two techniques suitable for low and medium adhesion strength tests.

  • Line Card

    Metrology Tools forSemiconductor, LED, Solar, FPD, MEMS, Data Storage

  • PV150

    The PV150 is the only all-in-one PV tester that can complete simple, fast and comprehensive PV testi.....

  • I-V Curve Tracer PV200

    The most compact & cost effective I-V curve tracer on the market

  • Solar Utility Pro

    A1500V 40A solar PV string checker

  • AFM Probes

  • SURFIX®X

    Modern coating thickness measurement: graphic display, PC connection, easy operation, as well as the.....

  • CCU-010 Compact Coating UNIT

    Sputtering, vaporising of carbon thread and plasma treatment (hydrophilic/hydrophobic) with one sing.....

  • SP-010 SPUTTERING MODULE

    An innovative interface with power and gas supply as well as signal transmission allows the modular .....

Industry application

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News information

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Elemental Analysis with Portable X-ray F..... 2022-06-30

The portable Counter Top XRF (CTX) is small, light-weight, safety-interlock.....

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